Application and Progress in the Scanning Probe Microscopy. Development of Single Electron Devices Fabricated by Scanning Tunneling Microscope(STM)/Atomic Force Microscope(AFM).
نویسندگان
چکیده
منابع مشابه
Application of Scanning Electron and Atomic Force Mode Microscopy on inscription from Proto-Elamite period in Tappeh Sofalin
The study of cultural heritage artifacts and the research of a protection and restoration intervention create with - and are often limited to - a complete characterization of their surface. This is not only factual for museum objects, but also for archaeological artifacts, because the object as it was discovered may contain precious unknown information that could be lost by too much aggressive ...
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The reconstructed surface structure of the II-VI semiconductor ZnTe (110), which is a promising material in the research field of semiconductor spintronics, was studied by scanning tunneling microscopy/spectroscopy (STM/STS). First, the surface states formed by reconstruction by the charge transfer of dangling bond electrons from cationic Zn to anionic Te atoms, which are similar to those of IV...
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ژورنال
عنوان ژورنال: Hyomen Kagaku
سال: 1997
ISSN: 0388-5321,1881-4743
DOI: 10.1380/jsssj.18.206